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Peak Instrument C-7200S 紫外可见光分光光度计 (1 nm)


Display: 7 inch LCD screen

Keyboard Control: Silicone Button

Optical System: - Double Beam

                - Holographic grating, 1200 lines/mm

Spectral Bandwidth: 1 nm

Wavelength Range: 190 - 1100nm

Wavelength Accuracy: ±0.3nm

Wavelength Repeatability: ≤0.2nm

Photometric Accuracy: 0.2%T(0-100%T), ±0.002A(0-0.5A), ±0.004A(0.5-1A)

Photometric Repeatability: ≤0.15%T(0-100%T), 0.001A(0-0.5A), 0.002A(0.5-1A)

Stray Light: ≤0.03%T@220nm,360nm

Stability: ±0.002A/h@500nm

Photometric Range: 0-200%T, -0.3-3.0A, 0-9999C(0-9999F)

Baseline Flatness: ±0.002A(200-1000nm)

Noise: 0.0003A@500nm

Working Mode: T,A,C,E

Wavelength Setting: Automatic

Scanning Speed: High, Medium and Low

Detector: Solid Silicon Photodiode

Light Source: Tungsten Halogen/Deuterium Lamp

Data Output: RS232, USB(A), USB(B)

Processor: Cortex_M3, 120Mhz

Power Requirements: AC 110-220V 50-60Hz

Shipping Dimensions & Weight: 770*630*340mm, 27kg



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